Testing of High-Resolution Si and Ge Analyzers for X-ray Emission Spectroscopy and X-ray Raman Scattering
A project at Stanford Linear Accelerator Center (SLAC) is currently underway for the building of a new multi-crystal x-ray spectrometer that will be used to probe the fundamental structures of light elements, including water, as well as 3d transition metals, such as metalloproteins, in dilute systems. Experimentation for determining the focal lengths for the prospective high-resolution, spherically-curved silicon (Si) and germanium (Ge) analyzers for the instrument and the energy resolutions at their respective focal points is described in this paper. The focal lengths of the Si and Ge analyzers being sampled are found by minimizing the focal size made from a diffused helium-neon (HeNe) gas laser operating at 632 nm (0.95 meV). Afterwards, the energy resolutions are determined by using synchrotron radiation (SR), in the range from 6-16 keV energies. The experiments were performed at Beamline 10-2 at the Stanford Synchrotron Radiation Laboratory (SSRL), a division of SLAC. This data, along with the energies of the incident beams, is used to determine which samples are most effective at focusing x-rays to the highest spatial and energy resolution. Sample Si (440)A, with a focal length of 1015.2 mm, is concluded to have the best energy resolution. Furthermore, a new multi-crystal goniometer was tested and commissioned. As part of this work, the device was prealigned into Rowland geometry, in order to facilitate the process of finding a single high-energy resolution x-ray focus for all 7 analyzers.
- Research Organization:
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Sponsoring Organization:
- USDOE Office of Science (US)
- DOE Contract Number:
- AC03-76SF00515
- OSTI ID:
- 833118
- Report Number(s):
- SLAC-TN-04-064; TRN: US0406573
- Resource Relation:
- Other Information: PBD: 3 Sep 2004
- Country of Publication:
- United States
- Language:
- English
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