Reliability of contemporary data-acquisition techniques for LEED analysis

Conference · Wed Oct 01 00:00:00 EDT 1980

OSTI ID:6342476

Noonan, J R; Davis, H L

It is becoming clear that one of the principal limitations in LEED structure analysis is the quality of the experimental I-V profiles. This limitation is discussed, and data acquisition procedures described, which for simple systems, seem to enhance the quality of agreement between the results of theoretical model calculations and experimental LEED spectra. By employing such procedures to obtain data from Cu(100), excellent agreement between computed and measured profiles has been achieved. 7 figures.

• Research Organization: Oak Ridge National Lab., TN (USA)
• DOE Contract Number: W-7405-ENG-26
• OSTI ID: 6342476
• Report Number(s): CONF-8006174-1(Draft); ON: DE81024078; TRN: 81-013206
• Resource Relation: Conference: Conference on determination of surface structures by LEED, Yorktown Heights, NY, USA, 19 Jun 1980
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
COPPER
ELECTRON DIFFRACTION
CRYSTALLOGRAPHY
DATA ACQUISITION
COHERENT SCATTERING
DIFFRACTION
ELEMENTS
METALS
SCATTERING
TRANSITION ELEMENTS
400103* - Radiometric & Radiochemical Procedures- (-1987)