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Title: Modifications of the beam profile in the new inclined crystal geometry

Conference ·
OSTI ID:6211163

The new inclined crystal geometry has been successfully used in high heat load X-ray monochromator tests. The important aspect of this geometry is that from a diffraction point of view, when properly aligned, is is a symmetric Bragg reflection; i.e., b = k{sub i} . n/k{sub out}.n = {minus}1. An interesting result of this geometry is that with a single reflection from an inclined crystal, the output X-ray beam shape changes dramatically while maintaining the same beam cross section area. For example, a parallel 8 keV input X-ray beam using Si(111) reflection, with an inclination angle of 70.5{degrees}, the output beam size is compressed by about a factor of 5.4 in one direction and expanded by the same factor in the other direction. This geometry can therefore, be used to alter the source line profile of in house X-ray generators and in some cases, be used to better match the sample size and the X-ray beam. The effect of this geometry on beam profiles, beam divergences and acceptance angles will be discussed.

Research Organization:
Argonne National Lab., IL (United States)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (United States)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
6211163
Report Number(s):
ANL/CP-74077; CONF-9110146-2; ON: DE92003446
Resource Relation:
Conference: 7. national conference and exhibition on synchrotron radiation instrumentation, Baton Rouge, LA (United States), 28-31 Oct 1991
Country of Publication:
United States
Language:
English