Dynamic phenomena studied with a CCD detector

Conference · Thu Aug 01 00:00:00 EDT 1991

OSTI ID:6168035

Brizard, C M; Rodricks, B G; Alp, E E ^[1]; MacHarrie, R ^[2]

---

1. Argonne National Lab., IL (United States)
2. AT and T Bell Labs., Murray Hill, NJ (United States)

A new programmable charge coupled device (CCD) detector based on the CAMAC (Computer Automated Measurement and Control) modular system and coupled to a MircoVax 3 computer has been developed for time-resolved synchrotron experiments. The programmability of the electronics allows one to use many kinds of CCD chip. Moreover, different detector modes can be chosen according to the time scale of the experiment. Various time-resolved x-ray scattering experiments have already been performed at NSLS and CHESS with this imaging system. For example, a real-time study of the early stages of crystallization of the amorphous metallic alloy Fe{sub 80}B{sub 20} was carried out at the X6 beamline at NSLS. Here a spin melt ribbon of the amorphous metal was resistively heated in stages in 600{degrees}C and the crystallization observed on the CCD. The detector angular acceptance of 3{degrees} allowed for the observation of the evolution of the {alpha}-Fe, and Fe{sub 3}B and the Fe{sub 2}B phases simultaneously on a minute time scale.

• Research Organization: Argonne National Lab., IL (United States)
• Sponsoring Organization: USDOE; USDOE, Washington, DC (United States)
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 6168035
• Report Number(s): ANL/CP-72291; CONF-910949-1; ON: DE92003404
• Resource Relation: Conference: 48. Reunion internationale de chimie physique: rayonnement synchrotron et phenomenes dynamiques, Grenoble (France), 9-13 Sep 1991
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
ANNEALING
DETECTION
CHARGE-COUPLED DEVICES
CRYSTALLIZATION
IRON BORIDES
STRESS RELAXATION
IRON
X-RAY DIFFRACTION
BORIDES
BORON COMPOUNDS
COHERENT SCATTERING
DIFFRACTION
ELEMENTS
HEAT TREATMENTS
IRON COMPOUNDS
METALS
PHASE TRANSFORMATIONS
RELAXATION
SCATTERING
SEMICONDUCTOR DEVICES
TRANSITION ELEMENT COMPOUNDS
TRANSITION ELEMENTS
420500* - Engineering- Materials Testing