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Title: A high resolution, single bunch, beam profile monitor

Conference ·
OSTI ID:10180482

Efficient linear colliders require very small beam spots to produce high luminosities with reasonable input power, which limits the number of electrons which can be accelerated to high energies. The small beams, in turn, require high precision and stability in all accelerator components. Producing, monitoring and maintaining beams of the required quality has been, and will continue to be, difficult. A beam monitoring system which could be used to measure beam profile, size and stability at the final focus of a beamline or collider has been developed and is described here. The system uses nonimaging bremsstrahlung optics. The immediate use for this system would be examining the final focus spot at the SLAC/FFTB. The primary alternatives to this technique are those proposed by P. Chen / J. Buon, which analyses the energy and angular distributions of ion recoils to determine the aspect ratio of the electron bunch, and a method proposed by Shintake, which measures intensity variation of compton backscattered photons as the beam is moved across a pattern of standing waves produced by a laser.

Research Organization:
Argonne National Lab., IL (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
10180482
Report Number(s):
ANL/HEP-CP-92-72; CONF-9206193-9; ON: DE92041127
Resource Relation:
Conference: Advanced accelerator concepts workshop,Port Jefferson, NY (United States),14-20 Jun 1992; Other Information: PBD: 26 Aug 1992
Country of Publication:
United States
Language:
English

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