Texture analysis of critical current density in Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub x} tapes
Conference
·
OSTI ID:10180016
- Illinois Inst. of Technology, Chicago, IL (United States)
- Argonne National Lab., IL (United States)
Ag-clad Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub x} tapes were fabricated by a powder-in-tube process. Transport critical current density (J{sub c}) data were obtained at 4.2 K. X-ray diffraction data were used to quantify the texture of each superconductor core. J{sub c} and texture data were related by a geometric model based on J{sub c} anisotropy within individual grains. The model, which fit the data well, is applicable to strongly linked superconductors only.
- Research Organization:
- Argonne National Lab., IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 10180016
- Report Number(s):
- ANL/ET/CP-83715; CONF-940926-1; ON: DE94018375
- Resource Relation:
- Conference: 7. conference on superconductivity and applications,Buffalo, NY (United States),7-9 Sep 1994; Other Information: PBD: Aug 1994
- Country of Publication:
- United States
- Language:
- English
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