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Title: NMR characterization of thin films

Abstract

A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.

Inventors:
 [1];  [2];  [3];  [4]
  1. Glenview, IL
  2. Homer Glen, IL
  3. Chicago, IL
  4. Westchester, IL
Publication Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
985652
Patent Number(s):
7,456,630
Application Number:
11/484,348; TRN: US201016%%2095
Assignee:
NMR characterization of thin films
DOE Contract Number:  
W-31-109-ENG-38
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CONTAINERS; THIN FILMS; MATERIALS

Citation Formats

Gerald, II, Rex E., Klingler, Robert J, Rathke, Jerome W, Diaz, Rocio, and Vukovic, Lela. NMR characterization of thin films. United States: N. p., 2008. Web.
Gerald, II, Rex E., Klingler, Robert J, Rathke, Jerome W, Diaz, Rocio, & Vukovic, Lela. NMR characterization of thin films. United States.
Gerald, II, Rex E., Klingler, Robert J, Rathke, Jerome W, Diaz, Rocio, and Vukovic, Lela. 2008. "NMR characterization of thin films". United States. https://www.osti.gov/servlets/purl/985652.
@article{osti_985652,
title = {NMR characterization of thin films},
author = {Gerald, II, Rex E. and Klingler, Robert J and Rathke, Jerome W and Diaz, Rocio and Vukovic, Lela},
abstractNote = {A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.},
doi = {},
url = {https://www.osti.gov/biblio/985652}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 25 00:00:00 EST 2008},
month = {Tue Nov 25 00:00:00 EST 2008}
}