Automated twin identification technique for use with electron backscatter diffraction.
- Benjamin Lyman
- Thomas A.
- John F.
Historically, twinning information has been obtained by optical microscopy, TEM, and neutron diffraction. Recent research has shown that automated electron backscatter diffraction (EBSD) can be used to extract reliable twinning statistics. An automated twin identification technique for use with EBSD has facilitated a greater understanding of deformation twinning in materials. The key features of this automated framework are the use of the crystallographic definition of twin relationships, the inclination of the common K, plane at a twin boundary, and the correct identification of the parent orientation in a parent/twin pair. The complex nature of the parent/twin interactions required the use of a voting scheme to correctly identify parent orientations. In those few cases were the voting scheme was unable to determine parent orientation (< 2 pct) the algorithm allows for manual selection. Twin area fractions are categorized by operative twin systems along with secondary and tertiary twinning. These statistics are reported for {alpha}-zirconium and 316L stainless steel. These improved twin statistics can help quantify deformation processes as well as provide validation of plasticity models for materials that exhibit deformation twinning.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 977929
- Report Number(s):
- LA-UR-04-7930; TRN: US201012%%817
- Resource Relation:
- Journal Volume: 495 - 497; Conference: Submitted to: ICOTOM 14, July 2005, Leuven
- Country of Publication:
- United States
- Language:
- English
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