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Title: Resonant inelastic soft x-ray scattering of CdS: a two-dimensional electronic structure map approach

Journal Article · · Physical Review B
OSTI ID:971546

Resonant inelastic x-ray scattering (RIXS) with soft x-rays is uniquely suited to study the elec-tronic structure of a variety of materials, but is currently limited by low (fluorescence yield) count rates. This limitation is overcome with a new high-transmission spectrometer that allows to measure soft x-ray RIXS"maps." The S L2,3 RIXS map of CdS is discussed and compared with density functional calculations. The map allows the extraction of decay channel-specific"absorp-tion spectra," giving detailed insight into the wave functions of occupied and unoccupied elec-tronic states.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
Advanced Light Source Division
DOE Contract Number:
DE-AC02-05CH11231
OSTI ID:
971546
Report Number(s):
LBNL-2342E; TRN: US1001223
Journal Information:
Physical Review B, Vol. 79; Related Information: Journal Publication Date: April 2009; ISSN 1098-0121
Country of Publication:
United States
Language:
English

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