Electronic Structure of the ID Conductor K0.3MoO3 studied using resonant inelastic x-ray scattering and soft x-ray emission spectroscopy

Journal Article · Wed Sep 24 00:00:00 EDT 2008 · Journal of Physics: Condensed Matter

DOI:https://doi.org/10.1088/0953-8984/20/41/415219· OSTI ID:941169

Learmonth, T; Glans, P -A; McGuinness, C; Plucinski, L; Zhang, Y; Guo, J -H; Greenblatt, M; Smith, K E

The electronic structure of the quasi-one dimensional conductor K{sub 0.3}MoO{sub 3} has been measured using high resolution resonant inelastic x-ray scattering and x-ray absorption spectroscopy. The data is compared to that from the related two dimensional insulator {alpha}-MoO{sub 3}. Scattering features are observed from both oxides that are explained in terms of the band momentum selectivity of the scattering process, allowing a comparison of the scattering data to recent band structure calculations.

• Research Organization: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: Advanced Light Source Division
• DOE Contract Number: DE-AC02-05CH11231
• OSTI ID: 941169
• Report Number(s): LBNL-1052E; TRN: US0807296
• Journal Information: Journal of Physics: Condensed Matter, Journal Name: Journal of Physics: Condensed Matter
• Country of Publication: United States
• Language: English

Related Subjects

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ABSORPTION SPECTROSCOPY
ELECTRONIC STRUCTURE
EMISSION SPECTROSCOPY
OXIDES
RESOLUTION
SCATTERING