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Title: Strength of Si Wafers with Microcracks: A Theoretical Model (Poster)

Conference ·

A new analytical expression that takes into account the surface, edge, and bulk properties of a wafer has been proposed to describe the strength of the brittle materials. A new proposed fracture-mechanics numerical simulation successfully predicted the strength of the cast silicon wafers. It has been shown that the predicted wafer strength distribution agrees well with the available experimental results.

Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC36-99-GO10337
OSTI ID:
939516
Report Number(s):
NREL/PO-520-43306; TRN: US200823%%230
Resource Relation:
Conference: Presented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California
Country of Publication:
United States
Language:
English