Short-Term Metal/Organic Interface Stability Investigations of Organic Photovoltaic Devices: Preprint
This paper addresses one source of degradation in OPV devices: the metal/organic interface. The basic approach was to study the completed device stability vs. the stability of the organic film itself as shown in subsequent devices fabricated from the films.
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC36-99-GO10337
- OSTI ID:
- 929629
- Report Number(s):
- NREL/CP-270-42568; TRN: US200813%%169
- Resource Relation:
- Conference: Presented at the 33rd IEEE Photovoltaic Specialists Conference, 11-16 May 2008, San Diego, California
- Country of Publication:
- United States
- Language:
- English
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