Sensitivity Analysis of the DARHT-II 2.5MV/2kA Diode
This report summarizes the study of the tolerance limits on the assembly of the cathode and the Pierce electrode for the DARHT-II diode (2.5 MV, 2 kA case), performed through a series of computer simulations using the PIC code WARP [1]. We have considered sources of beam quality degradation like the errors in axial and transverse positioning, and the size of the radial gap between the cathode and the Pierce electrode (shroud). The figure of merit was chosen to be the RMS beam (edge) emittance at a distance of 1 meter from the cathode, as defined by {var_epsilon}{sub x} = 4 {beta}{gamma} {radical}(<x{sup 2}><x{prime}{sup 2}>-<xx{prime}>{sup 2}) {center_dot}. The analysis shows that to position the cathode at the correct axial and transverse location is more important than the size of the radial gap.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Director. Office of Science. Fusion EnergySciences
- DOE Contract Number:
- DE-AC02-05CH11231
- OSTI ID:
- 928866
- Report Number(s):
- LBNL-62296; HIFAN 1562; R&D Project: Z41003; BnR: AT5015031; TRN: US200812%%558
- Country of Publication:
- United States
- Language:
- English
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