PASSIVATION OF SEMICONDUCTOR SURFACES FOR IMPROVED RADIATION DETECTORS: X-RAY PHOTOEMISSION ANALYSIS

Conference · Mon Dec 10 00:00:00 EST 2007

DOI:https://doi.org/10.1557/PROC-1038-O08-01· OSTI ID:924006

Nelson, A; Conway, A; Reinhardt, C; Ferreira, J; Nikolic, R; Payne, S

Surface passivation of device-grade radiation detector materials was investigated using x-ray photoelectron spectroscopy in combination with transport property measurements before and after various chemical treatments. Specifically Br-MeOH (2% Br), KOH with NH{sub 4}F/H{sub 2}O{sub 2} and NH{sub 4}OH solutions were used to etch, reduce and oxidize the surface of Cd{sub (1-x)}Zn{sub x}Te semiconductor crystals. Scanning electron microscopy was used to evaluate the resultant microscopic surface morphology. Angle-resolved high-resolution photoemission measurements on the valence band electronic structure and core lines were used to evaluate the surface chemistry of the chemically treated surfaces. Metal overlayers were then deposited on these chemically treated surfaces and the I-V characteristics measured. The measurements were correlated to understand the effect of interface chemistry on the electronic structure at these interfaces with the goal of optimizing the Schottky barrier height for improved radiation detector devices.

• Research Organization: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 924006
• Report Number(s): LLNL-PROC-400091; TRN: US0802000
• Resource Relation: Journal Volume: 1038; Conference: Presented at: Materials Research Society Fall 2007, Boston, MA, United States, Nov 26 - Nov 30, 2007
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHEMISTRY
ELECTRIC CONDUCTIVITY
ELECTRONIC STRUCTURE
MORPHOLOGY
PASSIVATION
PHOTOEMISSION
RADIATION DETECTORS
SCANNING ELECTRON MICROSCOPY
TRANSPORT
VALENCE
X-RAY PHOTOELECTRON SPECTROSCOPY