Predicting the reliability of electronic circuits.
Procedures to predict the reliability of electrical circuits are discussed. Three cases are introduced and discussed. In Case 1, an analyst predicts the probability of any failure in the intended relations between circuit inputs and circuit outputs. In Case 2, an analyst predicts the probability that specified unintended outputs would occur. In Case 3, an analyst considers coupling between circuits. Logic models are given for the three cases, and sources of failure probabilities of components are mentioned. Methods of analysis are given, software tools are mentioned, and recommendations for presentation and review of results are discussed.
- Research Organization:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 919204
- Report Number(s):
- SAND2004-2377; TRN: US200825%%96
- Country of Publication:
- United States
- Language:
- English
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