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Title: Predicting the reliability of electronic circuits.

Technical Report ·
DOI:https://doi.org/10.2172/919204· OSTI ID:919204

Procedures to predict the reliability of electrical circuits are discussed. Three cases are introduced and discussed. In Case 1, an analyst predicts the probability of any failure in the intended relations between circuit inputs and circuit outputs. In Case 2, an analyst predicts the probability that specified unintended outputs would occur. In Case 3, an analyst considers coupling between circuits. Logic models are given for the three cases, and sources of failure probabilities of components are mentioned. Methods of analysis are given, software tools are mentioned, and recommendations for presentation and review of results are discussed.

Research Organization:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
OSTI ID:
919204
Report Number(s):
SAND2004-2377; TRN: US200825%%96
Country of Publication:
United States
Language:
English