In-Situ TEM Study of Interface Sliding and Migration in an Ultrafine Lamellar Structure
The instability of interfaces in an ultrafine TiAl-({gamma})/Ti{sub 3}Al-({alpha}{sub 2}) lamellar structure by straining at room temperature has been investigated using in-situ straining techniques performed in a transmission electron microscope. The purpose of this study is to obtain experimental evidence to support the creep mechanisms based upon the interface sliding in association with a cooperative movement of interfacial dislocations previously proposed to interpret the nearly linear creep behavior observed from ultrafine lamellar TiAl alloys. The results have revealed that both the sliding and migration of lamellar interfaces can take place simultaneously as a result of the cooperative movement of interfacial dislocations.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 893576
- Report Number(s):
- UCRL-JRNL-217574; TRN: US200625%%412
- Journal Information:
- Journal of Materials Research, vol. 21, no. 10, October 1, 2006, pp. 2453, Journal Name: Journal of Materials Research, vol. 21, no. 10, October 1, 2006, pp. 2453
- Country of Publication:
- United States
- Language:
- English
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