FUTURE TRENDS IN MICROELECTRONICS - IMPACT ON DETECTOR READOUT.
Conference
·
OSTI ID:891913
Mainstream CMOS is now a well-established detector readout technology. We review technology scaling trends and limits, the implementation of analog circuits in digital CMOS processes, and radiation resistance. Emphasis is placed on the growing importance of power dissipation in ultra-scaled technologies.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- DOE/SC
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 891913
- Report Number(s):
- BNL-76773-2006-CP; R&D Project: PO24; KA-04-04; TRN: US0605506
- Resource Relation:
- Conference: SNIC SYMPOSIUM (STANFORD-NOVOSIBIRSK INSTRUMENTATION CONFERENCE); STANFORD, CA; 20060403 through 20060406
- Country of Publication:
- United States
- Language:
- English
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