Converting films for x-ray detectors, applied to amorphous silicon arrays.
Conference
·
OSTI ID:8902
This paper presents results from our on-going efforts to characterize semiconductor thin films for direct x-ray conversion. We deposit these thin films onto an amorphous silicon (a-Si:H) readout array with the overall goal of developing a large area x-ray detector for protein crystallography, and for other x-ray imaging fields.
- Research Organization:
- Argonne National Lab., IL (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- W-31-109-ENG-38
- OSTI ID:
- 8902
- Report Number(s):
- ANL/ECT/CP-95038; TRN: AH200117%%277
- Resource Relation:
- Conference: Fall Meeting of the Materials Research Society, Boston, MA (US), 12/01/1997--12/05/1997; Other Information: PBD: 5 Dec 1997
- Country of Publication:
- United States
- Language:
- English
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