Method And Apparatus For Evaluatin Of High Temperature Superconductors
Patent
·
OSTI ID:879246
- Palo Alto, CA
- Stanford, CA
A technique for evaluation of high-T.sub.c superconducting films and single crystals is based on measurement of temperature dependence of differential optical reflectivity of high-T.sub.c materials. In the claimed method, specific parameters of the superconducting transition such as the critical temperature, anisotropy of the differential optical reflectivity response, and the part of the optical losses related to sample quality are measured. The apparatus for performing this technique includes pump and probe sources, cooling means for sweeping sample temperature across the critical temperature and polarization controller for controlling a state of polarization of a probe light beam.
- Research Organization:
- Stanford Univ., CA (United States)
- DOE Contract Number:
- FG03-90ER14157
- Assignee:
- The Board of Trustees of the Leland Stanford Junior University (Stanford, CA)
- Patent Number(s):
- US 5574562
- Application Number:
- 08/359283
- OSTI ID:
- 879246
- Country of Publication:
- United States
- Language:
- English
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OSTI ID:879246