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Title: Method And Apparatus For Evaluatin Of High Temperature Superconductors

Patent ·
OSTI ID:879246

A technique for evaluation of high-T.sub.c superconducting films and single crystals is based on measurement of temperature dependence of differential optical reflectivity of high-T.sub.c materials. In the claimed method, specific parameters of the superconducting transition such as the critical temperature, anisotropy of the differential optical reflectivity response, and the part of the optical losses related to sample quality are measured. The apparatus for performing this technique includes pump and probe sources, cooling means for sweeping sample temperature across the critical temperature and polarization controller for controlling a state of polarization of a probe light beam.

Research Organization:
Stanford Univ., CA (United States)
DOE Contract Number:
FG03-90ER14157
Assignee:
The Board of Trustees of the Leland Stanford Junior University (Stanford, CA)
Patent Number(s):
US 5574562
Application Number:
08/359283
OSTI ID:
879246
Country of Publication:
United States
Language:
English

References (4)

Comment on ‘‘Thermal transport in a charged Bose gas and in high- T c oxides’’ journal January 1994
Density of normal carriers below T c and thermal resistance of twin boundaries in YBa 2 Cu 3 O 7 x single crystals journal September 1994
Precision measurements of the temperature dependence of λ in YBa 2 Cu 3 O 6.95 : Strong evidence for nodes in the gap function journal June 1993
Optical studies of the a -, b -, and c -axis charge dynamics in YBa 2 Cu 3 O 6 + x journal April 1993

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