Enhanced adhesion for LIGA microfabrication by using a buffer layer
Patent
·
OSTI ID:873943
- San Jose, CA
- Darien, IL
- Naperville, IL
The present invention is an improvement on the LIGA microfabrication process wherein a buffer layer is applied to the upper or working surface of a substrate prior to the placement of a resist onto the surface of the substrate. The buffer layer is made from an inert low-Z material (low atomic weight), a material that absorbs secondary X-rays emissions from the substrate that are generated from the substrate upon exposure to a primary X-rays source. Suitable materials for the buffer layer include polyamides and polyimide. The preferred polyimide is synthesized form pyromellitic anhydride and oxydianiline (PMDA-ODA).
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- DOE Contract Number:
- W-31109-ENG-38
- Assignee:
- United States of America as represented by United States Department (Washington, DC)
- Patent Number(s):
- US 6277539
- OSTI ID:
- 873943
- Country of Publication:
- United States
- Language:
- English
LIGA fabrication of mm-wave accelerating cavity structures at the Advanced Photon Source (APS)
|
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Adhesion problems in deep-etch x-ray lithography caused by fluorescence radiation from the plating base
|
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Similar Records
Enhanced adhesion for LIGA microfabrication by using a buffer layer
Enhanced adhesion for LIGA microfabrication by using a buffer layer
Ion bombardment of polyimide films
Patent Application
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Fri May 22 00:00:00 EDT 1998
·
OSTI ID:873943
Enhanced adhesion for LIGA microfabrication by using a buffer layer
Patent
·
Tue Jan 27 00:00:00 EST 2004
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OSTI ID:873943
Ion bombardment of polyimide films
Journal Article
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Sat Jul 01 00:00:00 EDT 1989
· J. Vac. Sci. Technol., A; (United States)
·
OSTI ID:873943
Related Subjects
enhanced
adhesion
liga
microfabrication
buffer
layer
improvement
process
applied
upper
surface
substrate
prior
placement
resist
inert
low-z
material
atomic
weight
absorbs
secondary
x-rays
emissions
generated
exposure
primary
source
suitable
materials
polyamides
polyimide
preferred
synthesized
form
pyromellitic
anhydride
oxydianiline
pmda-oda
atomic weight
primary x-rays
low-z material
suitable material
buffer layer
fabrication process
secondary x-rays
suitable materials
substrate prior
enhanced adhesion
liga microfabrication
/430/
adhesion
liga
microfabrication
buffer
layer
improvement
process
applied
upper
surface
substrate
prior
placement
resist
inert
low-z
material
atomic
weight
absorbs
secondary
x-rays
emissions
generated
exposure
primary
source
suitable
materials
polyamides
polyimide
preferred
synthesized
form
pyromellitic
anhydride
oxydianiline
pmda-oda
atomic weight
primary x-rays
low-z material
suitable material
buffer layer
fabrication process
secondary x-rays
suitable materials
substrate prior
enhanced adhesion
liga microfabrication
/430/