High resolution non-contact interior profilometer

Patent · Mon Jan 01 00:00:00 EST 2001

OSTI ID:873718

Piltch, Martin S ^[1]; Patterson, R Alan ^[1]; Leeches, Gerald W ^[1]; Nierop, John Van ^[2]; Teti, John J ^[3]

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1. Los Alamos, NM
2. Largo, FL
3. Tampa, FL

Apparatus and method for inspecting the interior surfaces of devices such as vessels having a single entry port. Laser energy is launched into the vessel, and the light reflected from the interior surfaces is interfered with reference laser energy to produce an interference pattern. This interference pattern is analyzed to reveal information about the condition of the interior surfaces of the device inspected.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
• DOE Contract Number: W-7405-ENG-36
• Assignee: Regents of University of California (Los Alamos, NM)
• Patent Number(s): US 6229617
• OSTI ID: 873718
• Country of Publication: United States
• Language: English

Related Subjects

resolution
non-contact
interior
profilometer
apparatus
method
inspecting
surfaces
devices
vessels
single
entry
laser
energy
launched
vessel
light
reflected
interfered
reference
produce
interference
pattern
analyzed
reveal
information
condition
device
inspected
reference laser
light reflected
interference pattern
interior surface
interior surfaces
laser energy
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