Uncooled infrared photon detector and multicolor infrared detection using microoptomechanical sensors
Patent
·
OSTI ID:872632
- Knoxville, TN
Systems and methods for infrared detection are described. An optomechanical photon detector includes a semiconductor material and is based on measurement of a photoinduced lattice strain. A multicolor infrared sensor includes a stack of frequency specific optomechanical detectors. The stack can include one, or more, of the optomechanical photon detectors that function based on the measurement of photoinduced lattice strain. The systems and methods provide advantages in that rapid, sensitive multicolor infrared imaging can be performed without the need for a cooling subsystem.
- Research Organization:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- DOE Contract Number:
- AC04-76
- Assignee:
- Lockheed Martin Energy Research Corporation (Oak Ridge, TN)
- Patent Number(s):
- US 5977544
- OSTI ID:
- 872632
- Country of Publication:
- United States
- Language:
- English
Effect of electronic strain on photoacoustic generation in silicon
|
journal | November 1985 |
Applicability of the classical curvatureāstress relation for thin films on plate substrates
|
journal | November 1989 |
Remote infrared radiation detection using piezoresistive microcantilevers
|
journal | November 1996 |
Photostriction Effect in Germanium
|
journal | January 1961 |
Similar Records
Uncooled infrared photon detector and multicolor infrared detection using microoptomechanical sensors
Micromechanical Uncooled Photon Detectors
Uncooled IR photon detection using MEMS micro-structures
Patent
·
Tue Nov 02 00:00:00 EST 1999
·
OSTI ID:872632
Micromechanical Uncooled Photon Detectors
Conference
·
Tue Sep 04 00:00:00 EDT 2001
·
OSTI ID:872632
Uncooled IR photon detection using MEMS micro-structures
Technical Report
·
Sat Aug 01 00:00:00 EDT 1998
·
OSTI ID:872632
Related Subjects
uncooled
infrared
photon
detector
multicolor
detection
microoptomechanical
sensors
systems
methods
described
optomechanical
semiconductor
material
based
measurement
photoinduced
lattice
strain
sensor
stack
frequency
specific
detectors
function
provide
advantages
rapid
sensitive
imaging
performed
cooling
subsystem
semiconductor material
provide advantages
methods provide
photon detector
lattice strain
infrared detection
infrared imaging
mechanical sensors
mechanical sensor
/250/73/356/
infrared
photon
detector
multicolor
detection
microoptomechanical
sensors
systems
methods
described
optomechanical
semiconductor
material
based
measurement
photoinduced
lattice
strain
sensor
stack
frequency
specific
detectors
function
provide
advantages
rapid
sensitive
imaging
performed
cooling
subsystem
semiconductor material
provide advantages
methods provide
photon detector
lattice strain
infrared detection
infrared imaging
mechanical sensors
mechanical sensor
/250/73/356/