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Title: Magnetic lens apparatus for a low-voltage high-resolution electron microscope

Patent ·
OSTI ID:870631

A lens apparatus in which a beam of charged particles of low accelerating voltage is brought to a focus by a magnetic field, the lens being situated behind the target position. The lens comprises an electrically-conducting coil arranged around the axis of the beam and a magnetic pole piece extending along the axis of the beam at least within the space surrounded by the coil. The lens apparatus comprises the sole focusing lens for high-resolution imaging in a low-voltage scanning electron microscope.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
DOE Contract Number:
FG02-86ER60437
Assignee:
Arch Development Corporation (Chicago, IL)
Patent Number(s):
US 5563415
OSTI ID:
870631
Country of Publication:
United States
Language:
English

References (2)

Limits of electron probe formation journal May 1995
Unconventional Lens Design book January 1982