Method for measuring the contour of a machined part

Patent · Tue May 30 00:00:00 EDT 1995

OSTI ID:869899

Bieg, Lothar F ^[1]

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1. Louisville, CO

A method for measuring the contour of a machined part with a contour gage apparatus, having a probe assembly including a probe tip for providing a measure of linear displacement of the tip on the surface of the part. The contour gage apparatus may be moved into and out of position for measuring the part while the part is still carried on the machining apparatus. Relative positions between the part and the probe tip may be changed, and a scanning operation is performed on the machined part by sweeping the part with the probe tip, whereby data points representing linear positions of the probe tip at prescribed rotation intervals in the position changes between the part and the probe tip are recorded. The method further allows real-time adjustment of the apparatus machining the part, including real-time adjustment of the machining apparatus in response to wear of the tool that occurs during machining.

• Research Organization: Rockwell International Corp., Canoga Park, CA (United States)
• DOE Contract Number: AC04-76DP03533
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 5419222
• Application Number: 08/145,537
• OSTI ID: 869899
• Country of Publication: United States
• Language: English

Related Subjects

method
measuring
contour
machined
gage
apparatus
probe
assembly
including
tip
providing
measure
linear
displacement
surface
moved
position
carried
machining
relative
positions
changed
scanning
operation
performed
sweeping
whereby
data
representing
prescribed
rotation
intervals
changes
recorded
allows
real-time
adjustment
response
wear
tool
occurs
relative position
machining apparatus
linear displacement
probe assembly
probe tip
assembly including
relative positions
whereby data
contour gage
/82/409/