Image intensifier gain uniformity improvements in sealed tubes by selective scrubbing
- Livermore, CA
The gain uniformity of sealed microchannel plate image intensifiers (MCPIs) is improved by selectively scrubbing the high gain sections with a controlled bright light source. Using the premise that ions returning to the cathode from the microchannel plate (MCP) damage the cathode and reduce its sensitivity, a HeNe laser beam light source is raster scanned across the cathode of a microchannel plate image intensifier (MCPI) tube. Cathode current is monitored and when it exceeds a preset threshold, the sweep rate is decreased 1000 times, giving 1000 times the exposure to cathode areas with sensitivity greater than the threshold. The threshold is set at the cathode current corresponding to the lowest sensitivity in the active cathode area so that sensitivity of the entire cathode is reduced to this level. This process reduces tube gain by between 10% and 30% in the high gain areas while gain reduction in low gain areas is negligible.
- Research Organization:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- DOE Contract Number:
- W-7405-ENG-48
- Assignee:
- Regents of University of California (Oakland, CA)
- Patent Number(s):
- US 5408087
- OSTI ID:
- 869841
- Country of Publication:
- United States
- Language:
- English
Microchannel plate intensifier gain uniformity improvement in sealed tubes by selective scrubbing
|
conference | January 1993 |
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Microchannel plate intensifier gain uniformity improvement in sealed tubes by selective scrubbing
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intensifier
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microchannel
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mcpis
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controlled
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premise
returning
cathode
mcp
damage
reduce
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hene
laser
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raster
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