Apparatus and method for measuring and imaging surface resistance

Martens, Jon S; Hietala, Vincent M; Hohenwarter, Gert K. G.

Title: Apparatus and method for measuring and imaging surface resistance

Patent · Fri Jan 01 00:00:00 EST 1993

OSTI ID:868897

Martens, Jon S ^[1]; Hietala, Vincent M ^[2]; Hohenwarter, Gert K. G. ^[3]

Albuquerque, NM
Placitas, NM
Madison, WI

Apparatus and method for determining and imaging superconductor surface resistance. The apparatus comprises modified Gaussian confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor.

View Patent

Cite

Export

Save

Assignee:: United States of America as represented by United States (Washington, DC)

Patent Number(s):: US 5239269

Application Number:: 07/789,225

OSTI ID:: 868897

Country of Publication:: United States

Language:: English

References (7)

Morphology control and high critical currents in superconducting thin films in the Tl-Ca-Ba-Cu-O system Ginley, D. S.; Kwak, J. F.; Venturini, E. L. Physica C: Superconductivity, Vol. 160, Issue 1 https://doi.org/10.1016/0921-4534(89)90450-4	journal	August 1989
The effects of processing sequences on the microwave surface resistance of TlCaBaCuO Martens, J. S.; Zipperian, T. E.; Ginley, D. S. Journal of Applied Physics, Vol. 69, Issue 12 https://doi.org/10.1063/1.347434	journal	June 1991
Infrared and Optical Masers Schawlow, A. L.; Townes, C. H. Physical Review, Vol. 112, Issue 6 https://doi.org/10.1103/PhysRev.112.1940	journal	December 1958
Confocal resonators for measuring the surface resistance of high‐temperature superconducting films Martens, J. S.; Hietala, V. M.; Ginley, D. S. Applied Physics Letters, Vol. 58, Issue 22 https://doi.org/10.1063/1.104821	journal	June 1991
Microwave surface resistance of YBa ₂ Cu ₃ O _6.9 superconducting films Martens, J. S.; Beyer, J. B.; Ginley, D. S. Applied Physics Letters, Vol. 52, Issue 21 https://doi.org/10.1063/1.99726	journal	May 1988
The role of low temperatures in the operation of logic circuitry Keyes, R. W.; Harris, E. P.; Konnerth, K. L. Proceedings of the IEEE, Vol. 58, Issue 12 https://doi.org/10.1109/PROC.1970.8063	journal	January 1970
On the Focused Fabry-Perot Resonator in Plasma Diagnostics (Correspondence) Lonngren, K. E.; Mink, J. W.; Beyer, J. B. IEEE Transactions on Microwave Theory and Techniques, Vol. 12, Issue 5 https://doi.org/10.1109/TMTT.1964.1125873	journal	September 1964

Similar Records

Surface property detection apparatus and method

Patent · Tue Aug 08 00:00:00 EDT 1995 · OSTI ID:868897

Martens, J S; Ginley, D S; Hietala, V M; +1 more

Surface property detection apparatus and method

Patent · Sun Jan 01 00:00:00 EST 1995 · OSTI ID:868897

Martens, Jon S; Ginley, David S; Hietala, Vincent M; +1 more

Apparatus and method for measuring and imaging surface resistance

Patent · Tue Aug 24 00:00:00 EDT 1993 · OSTI ID:868897

Martens, J S; Hietala, V M; Hohenwarter, G K.G.

Related Subjects

apparatus
method
measuring
imaging
surface
resistance
determining
superconductor
comprises
modified
gaussian
confocal
resonator
structure
sample
remote
radiating
mirror
determined
analyzing
reflected
microwaves
reveals
anomalies
due
impurities
non-stoichiometry
surface resistance
apparatus comprises
apparatus comprise
resonator structure
surface impurities
imaging surface
sample remote
reflected microwave
confocal resonator
/324/

Title: Apparatus and method for measuring and imaging surface resistance

Citation Formats

References (7)

Similar Records

Related Subjects