Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures

Patent · Wed Jan 01 00:00:00 EST 1992

OSTI ID:868551

Ortiz, Marcos G ^[1]

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1. Idaho Falls, ID

A method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system.

• Research Organization: EG & G IDAHO INC
• DOE Contract Number: AC07-76ID01570
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 5165794
• OSTI ID: 868551
• Country of Publication: United States
• Language: English

Related Subjects

method
thermal
characterization
visualization
integrity
evaluation
conducting
material
samples
complex
structures
modeling
sample
structure
called
regions
comprise
electrical
network
resistances
measuring
electric
resistance
selected
pairs
external
leads
attached
surface
lead
basic
circuit
theory
translating
measured
temperatures
thermophysical
properties
corresponding
conducting material
physical properties
material sample
electric resistance
material samples
complex structures
electrical network
integrity evaluation
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