Built-in-test by signature inspection (bitsi)

Patent · Tue Jan 01 00:00:00 EST 1991

OSTI ID:867999

Bergeson, Gary C ^[1]; Morneau, Richard A ^[1]

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1. Idaho Falls, ID

A system and method for fault detection for electronic circuits. A stimulus generator sends a signal to the input of the circuit under test. Signature inspection logic compares the resultant signal from test nodes on the circuit to an expected signal. If the signals do not match, the signature inspection logic sends a signal to the control logic for indication of fault detection in the circuit. A data input multiplexer between the test nodes of the circuit under test and the signature inspection logic can provide for identification of the specific node at fault by the signature inspection logic. Control logic responsive to the signature inspection logic conveys information about fault detection for use in determining the condition of the circuit. When used in conjunction with a system test controller, the built-in test by signature inspection system and method can be used to poll a plurality of circuits automatically and continuous for faults and record the results of such polling in the system test controller.

• Research Organization: EG & G IDAHO INC
• DOE Contract Number: AC07-76ID01570
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 5051996
• OSTI ID: 867999
• Country of Publication: United States
• Language: English

Related Subjects

built-in-test
signature
inspection
bitsi
method
fault
detection
electronic
circuits
stimulus
generator
sends
signal
input
circuit
logic
compares
resultant
nodes
expected
signals
match
control
indication
data
multiplexer
provide
identification
specific
node
responsive
conveys
information
determining
condition
conjunction
controller
built-in
poll
plurality
automatically
continuous
faults
record
results
polling
signature inspection
resultant signal
control logic
electronic circuit
fault detection
electronic circuits
data input
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