Normal incidence X-ray mirror for chemical microanalysis
- Tijeras, NM
A non-planar, focusing mirror, to be utilized in both electron column instruments and micro-x-ray fluorescence instruments for performing chemical microanalysis on a sample, comprises a concave, generally spherical base substrate and a predetermined number of alternating layers of high atomic number material and low atomic number material contiguously formed on the base substrate. The thickness of each layer is an integral multiple of the wavelength being reflected and may vary non-uniformly according to a predetermined design. The chemical analytical instruments in which the mirror is used also include a predetermined energy source for directing energy onto the sample and a detector for receiving and detecting the x-rays emitted from the sample; the non-planar mirror is located between the sample and detector and collects the x-rays emitted from the sample at a large solid angle and focuses the collected x-rays to the sample. For electron column instruments, the wavelengths of interest lie above 1.5 nm, while for x-ray fluorescence instruments, the range of interest is below 0.2 nm. Also, x-ray fluorescence instruments include an additional non-planar focusing mirror, formed in the same manner as the previously described m The invention described herein was made in the performance of work under contract with the Department of Energy, Contract No. DE-AC04-76DP00789, and the United States Government has rights in the invention pursuant to this contract.
- Research Organization:
- AT&T
- DOE Contract Number:
- AC04-76DP00789
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Number(s):
- US 4916721
- OSTI ID:
- 867337
- Country of Publication:
- United States
- Language:
- English
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incidence
x-ray
mirror
chemical
microanalysis
non-planar
focusing
utilized
electron
column
instruments
micro-x-ray
fluorescence
performing
sample
comprises
concave
spherical
base
substrate
predetermined
alternating
layers
atomic
material
contiguously
formed
thickness
layer
integral
multiple
wavelength
reflected
vary
non-uniformly
according
design
analytical
energy
source
directing
detector
receiving
detecting
x-rays
emitted
located
collects
solid
angle
focuses
collected
wavelengths
lie
nm
range
below
additional
manner
previously
described
performance
contract
department
de-ac04-76dp00789
united
government
rights
pursuant
solid angle
analytical instruments
predetermined energy
normal incidence
focusing mirror
alternating layers
energy source
base substrate
x-ray fluorescence
analytical instrument
previously described
rays emitted
chemical microanalysis
x-ray mirror
integral multiple
directing energy
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