Photoconductive circuit element reflectometer

Patent · Mon Jan 01 00:00:00 EST 1990

OSTI ID:867253

Rauscher, Christen ^[1]

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1. Alexandria, VA

A photoconductive reflectometer for characterizing semiconductor devices at millimeter wavelength frequencies where a first photoconductive circuit element (PCE) is biased by a direct current voltage source and produces short electrical pulses when excited into conductance by short first laser light pulses. The electrical pulses are electronically conditioned to improve the frequency related amplitude characteristics of the pulses which thereafter propagate along a transmission line to a device under test. Second PCEs are connected along the transmission line to sample the signals on the transmission line when excited into conductance by short second laser light pulses, spaced apart in time a variable period from the first laser light pulses. Electronic filters connected to each of the second PCEs act as low-pass filters and remove parasitic interference from the sampled signals and output the sampled signals in the form of slowed-motion images of the signals on the transmission line.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
• DOE Contract Number: W-7405-ENG-36
• Assignee: United States of America as represented by Department of Energy (Washington, DC)
• Patent Number(s): US 4896109
• OSTI ID: 867253
• Country of Publication: United States
• Language: English

Related Subjects

photoconductive
circuit
element
reflectometer
characterizing
semiconductor
devices
millimeter
wavelength
frequencies
pce
biased
direct
current
voltage
source
produces
electrical
pulses
excited
conductance
laser
light
electronically
conditioned
improve
frequency
related
amplitude
characteristics
thereafter
propagate
transmission
line
device
pces
connected
sample
signals
spaced
apart
time
variable
period
electronic
filters
low-pass
remove
parasitic
interference
sampled
output
form
slowed-motion
images
pass filters
voltage source
light pulses
direct current
transmission line
laser light
spaced apart
semiconductor device
semiconductor devices
electrical pulses
light pulse
pass filter
circuit element
millimeter wavelength
millimeter wave
frequency related
electrical pulse
characterizing semiconductor
low-pass filter
photoconductive circuit
sampled signal
current voltage
wavelength frequencies
amplitude characteristic
conductive circuit
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