Method and apparatus for simultaneously measuring temperature and pressure

Patent · Fri Jan 01 00:00:00 EST 1988

OSTI ID:866708

Hirschfeld, Tomas B ^[1]; Haugen, Gilbert R ^[2]

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1. Livermore, CA
2. Pleasanton, CA

Method and apparatus are provided for simultaneously measuring temperature and pressure in a class of crystalline materials having anisotropic thermal coefficients and having a coefficient of linear compression along the crystalline c-axis substantially the same as those perpendicular thereto. Temperature is determined by monitoring the fluorescence half life of a probe of such crystalline material, e.g., ruby. Pressure is determined by monitoring at least one other fluorescent property of the probe that depends on pressure and/or temperature, e.g., absolute fluorescent intensity or frequency shifts of fluorescent emission lines.

• Research Organization: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
• DOE Contract Number: W-7405-ENG-48
• Assignee: Regents of University of California (Berkeley, CA)
• Patent Number(s): US 4768886
• OSTI ID: 866708
• Country of Publication: United States
• Language: English

Related Subjects

method
apparatus
simultaneously
measuring
temperature
pressure
provided
crystalline
materials
anisotropic
thermal
coefficients
coefficient
linear
compression
c-axis
substantially
perpendicular
thereto
determined
monitoring
fluorescence
half
life
probe
material
ruby
fluorescent
property
depends
absolute
intensity
frequency
shifts
emission
lines
simultaneously measuring
perpendicular thereto
measuring temperature
crystalline materials
frequency shift
crystalline material
emission line
thermal coefficient
c-axis substantially
emission lines
half life
fluorescent emission
thermal coefficients
anisotropic thermal
axis substantially
/374/73/