Methods and apparatus for measuring the tightness of enclosures

Patent · Tue Jan 13 00:00:00 EST 1987

OSTI ID:866107

Modera, Mark P ^[1]; Sherman, Max H ^[2]

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1. 3815 Brighton Ave., Oakland, CA 94602
2. 461 Hudson St., Oakland, CA 94618

Disclosed are methods and apparatus for measuring tightness of an enclosure such as a building by utilizing alternating pressurization techniques. One method comprises providing apparatus capable of causing an internal volume change for the enclosure, the apparatus including a means for determining the instantaneous volume change, and a means for determining the instantaneous pressure within the enclosure. The apparatus is operated within the enclosure to change the volume thereof, and at least one of the frequency and the displacement is adjusted to achieve a root mean square pressure in the enclosure approximately equal to a reference pressure. At that pressure, the leakage of the enclosure is determined from the instantaneous displacement and instantaneous pressure values.

• Research Organization: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC03-76SF00098
• Assignee: Modera, Mark P. (3815 Brighton Ave., Oakland, CA 94602);Sherman, Max H. (461 Hudson St., Oakland, CA 94618)
• Patent Number(s): US 4635469
• OSTI ID: 866107
• Country of Publication: United States
• Language: English

Related Subjects

methods
apparatus
measuring
tightness
enclosures
disclosed
enclosure
building
utilizing
alternating
pressurization
techniques
method
comprises
providing
capable
causing
internal
volume
change
including
means
determining
instantaneous
pressure
operated
frequency
displacement
adjusted
achieve
root
mean
square
approximately
equal
reference
leakage
determined
values
internal volume
comprises providing
approximately equal
method comprises
apparatus including
apparatus capable
pressure value
method comprise
root mean
mean square
pressure values
utilizing alternating
/73/