Ion source for high-precision mass spectrometry

Patent · Sun Jan 01 00:00:00 EST 1984

OSTI ID:865095

Todd, Peter J ^[1]; McKown, Henry S ^[1]; Smith, David H ^[1]

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1. Oak Ridge, TN

The invention is directed to a method for increasing the precision of positive-ion relative abundance measurements conducted in a sector mass spectrometer having an ion source for directing a beam of positive ions onto a collimating slit. The method comprises incorporating in the source an electrostatic lens assembly for providing a positive-ion beam of circular cross section for collimation by the slit.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
• DOE Contract Number: W-7405-ENG-26
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4459481
• OSTI ID: 865095
• Country of Publication: United States
• Language: English

Related Subjects

source
high-precision
mass
spectrometry
directed
method
increasing
precision
positive-ion
relative
abundance
measurements
conducted
sector
spectrometer
directing
beam
positive
collimating
slit
comprises
incorporating
electrostatic
lens
assembly
providing
circular
section
collimation
lens assembly
method comprises
mass spectrometer
mass spectrometry
method comprise
sector mass
electrostatic lens
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