High temperature measuring device
- West Richland, WA
A temperature measuring device for very high design temperatures (to 2,000.degree. C.). The device comprises a homogenous base structure preferably in the form of a sphere or cylinder. The base structure contains a large number of individual walled cells. The base structure has a decreasing coefficient of elasticity within the temperature range being monitored. A predetermined quantity of inert gas is confined within each cell. The cells are dimensionally stable at the normal working temperature of the device. Increases in gaseous pressure within the cells will permanently deform the cell walls at temperatures within the high temperature range to be measured. Such deformation can be correlated to temperature by calibrating similarly constructed devices under known time and temperature conditions.
- Research Organization:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
- DOE Contract Number:
- EY-76-C-06-1830
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Number(s):
- US 4386049
- OSTI ID:
- 864566
- Country of Publication:
- United States
- Language:
- English
Similar Records
High-temperature-measuring device
Research and Development Activities Waste Fixation Program. Quarterly progress report, July--September 1976
Related Subjects
measuring
device
design
temperatures
000
degree
comprises
homogenous
base
structure
preferably
form
sphere
cylinder
contains
individual
walled
cells
decreasing
coefficient
elasticity
range
monitored
predetermined
quantity
inert
gas
confined
cell
dimensionally
stable
normal
increases
gaseous
pressure
permanently
deform
walls
measured
deformation
correlated
calibrating
similarly
constructed
devices
time
conditions
temperature measuring
temperature conditions
device comprises
temperature range
inert gas
measuring device
dimensionally stable
structure contains
base structure
structure preferably
cell wall
walled cell
/376/116/340/374/