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Title: Fast transient digitizer

Abstract

Method and apparatus for sequentially scanning a plurality of target elements with an electron scanning beam modulated in accordance with variations in a high-frequency analog signal to provide discrete analog signal samples representative of successive portions of the analog signal; coupling the discrete analog signal samples from each of the target elements to a different one of a plurality of high speed storage devices; converting the discrete analog signal samples to equivalent digital signals; and storing the digital signals in a digital memory unit for subsequent measurement or display.

Inventors:
 [1]
  1. Palo Alto, CA
Publication Date:
Research Org.:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
OSTI Identifier:
864437
Patent Number(s):
US 4364029
Assignee:
United States of America as represented by Department of Energy (Washington, DC)
DOE Contract Number:  
AC03-76SF00515
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
fast; transient; digitizer; method; apparatus; sequentially; scanning; plurality; target; elements; electron; beam; modulated; accordance; variations; high-frequency; analog; signal; provide; discrete; samples; representative; successive; portions; coupling; speed; storage; devices; converting; equivalent; digital; signals; storing; memory; unit; subsequent; measurement; display; digital signals; scanning beam; digital signal; storage device; analog signal; storage devices; transient digitizer; frequency analog; provide discrete; successive portions; sequentially scan; target element; /315/324/341/

Citation Formats

Villa, Francesco. Fast transient digitizer. United States: N. p., 1982. Web.
Villa, Francesco. Fast transient digitizer. United States.
Villa, Francesco. 1982. "Fast transient digitizer". United States. https://www.osti.gov/servlets/purl/864437.
@article{osti_864437,
title = {Fast transient digitizer},
author = {Villa, Francesco},
abstractNote = {Method and apparatus for sequentially scanning a plurality of target elements with an electron scanning beam modulated in accordance with variations in a high-frequency analog signal to provide discrete analog signal samples representative of successive portions of the analog signal; coupling the discrete analog signal samples from each of the target elements to a different one of a plurality of high speed storage devices; converting the discrete analog signal samples to equivalent digital signals; and storing the digital signals in a digital memory unit for subsequent measurement or display.},
doi = {},
url = {https://www.osti.gov/biblio/864437}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Jan 01 00:00:00 EST 1982},
month = {Fri Jan 01 00:00:00 EST 1982}
}