Differential auger spectrometry

Patent · Thu Jan 01 00:00:00 EST 1976

OSTI ID:862584

Strongin, Myron; Varma, Matesh Narayan; Anne, Joshi

Differential Auger spectroscopy method for increasing the sensitivity of micro-Auger spectroanalysis of the surfaces of dilute alloys, by alternately periodically switching an electron beam back and forth between an impurity free reference sample and a test sample containing a trace impurity. The Auger electrons from the samples produce representative Auger spectrum signals which cancel to produce an Auger test sample signal corresponding to the amount of the impurity in the test samples.

• Research Organization: Brookhaven National Laboratory (BNL), Upton, NY (United States)
• Sponsoring Organization: US Atomic Energy Commission (AEC)
• DOE Contract Number: AT(30-1)-16
• Assignee: United States of America as represented by United States Energy (Washington, DC)
• Patent Number(s): 3,965,351
• Application Number: 05/519324
• OSTI ID: 862584
• Resource Relation: Patent File Date: 1974 Oct 30
• Country of Publication: United States
• Language: English

Related Subjects

differential
auger
spectrometry
spectroscopy
method
increasing
sensitivity
micro-auger
spectroanalysis
surfaces
dilute
alloys
alternately
periodically
switching
electron
beam
forth
impurity
free
reference
sample
containing
trace
electrons
samples
produce
representative
spectrum
signals
cancel
signal
corresponding
amount
signal corresponding
spectroscopy method
sample signal
sample containing
electron beam
reference sample
trace impurity
differential auger
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