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Title: THz near-field imaging of biological tissues employing synchrotronradiation

Conference ·
OSTI ID:861240

Terahertz scanning near-field infrared microscopy (SNIM) below 1 THz is demonstrated. The near-field technique benefits from the broadband and highly brilliant coherent synchrotron radiation (CSR) from an electron storage ring and from a detection method based on locking onto the intrinsic time structure of the synchrotron radiation. The scanning microscope utilizes conical wave guides as near-field probes with apertures smaller than the wavelength. Different cone approaches have been investigated to obtain maximum transmittance. Together with a Martin-Puplett spectrometer the set-up enables spectroscopic mapping of the transmittance of samples well below the diffraction limit. Spatial resolution down to about lambda/40 at 2 wavenumbers (0.06 THz) is derived from the transmittance spectra of the near-field probes. The potential of the technique is exemplified by imaging biological samples. Strongly absorbing living leaves have been imaged in transmittance with a spatial resolution of 130 mu-m at about 12 wave numbers (0.36 THz). The THz near-field images reveal distinct structural differences of leaves from different plants investigated. The technique presented also allows spectral imaging of bulky organic tissues. Human teeth samples of various thicknesses have been imaged between 2 and 20 wavenumbers (between 0.06and 0.6 THz). Regions of enamel and dentin within tooth samples are spatially and spectrally resolved, and buried caries lesions are imaged through both the outer enamel and into the underlying dentin.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Director. Office of Science. Office of High EnergyPhysics
DOE Contract Number:
DE-AC02-05CH11231
OSTI ID:
861240
Report Number(s):
LBNL-56793; R&D Project: AJ04MA; TRN: US0600283
Resource Relation:
Conference: SPIE Photonics West, San Jose, CA, January 22-27,2004
Country of Publication:
United States
Language:
English