XPS and AES Studies of Cu/CdTe(111)-B
Conference
·
OSTI ID:860680
Copper is frequently used as a p-type dopant to improve the performance of back contacts in CdTe thin-film solar cells. In this study, surface-analysis techniques are used to probe fundamental interactions between Cu and the CdTe(111)-B surface. The results presented here were facilitated by the newly constructed surface-analysis cluster tool in the Measurements and Characterization Division at NREL; they reveal a host of fundamental phenomena that occur in the Cu/CdTe system.
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC36-99-GO10337
- OSTI ID:
- 860680
- Report Number(s):
- NREL/CP-520-37038; TRN: US200524%%231
- Resource Relation:
- Related Information: Presented at the 2004 DOE Solar Energy Technologies Program Review Meeting, 25-28 October 2004, Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102005-2067; NREL/CD-520-37140)
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
14 SOLAR ENERGY
36 MATERIALS SCIENCE
COPPER
PERFORMANCE
PROBES
SOLAR CELLS
X-RAY PHOTOELECTRON SPECTROSCOPY
SOLAR ENERGY
PV
X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)
P-TYPE DOPANT
BACK CONTACTS
THIN-FILM
TEMPERATURE-PROGRAMMED DESORPTION (TPD)
SCANNING AUGER MICROSCOPY (SAM)
AUGER ELECTRON SPECTROSCOPY (AES)
Solar Energy - Photovoltaics
36 MATERIALS SCIENCE
COPPER
PERFORMANCE
PROBES
SOLAR CELLS
X-RAY PHOTOELECTRON SPECTROSCOPY
SOLAR ENERGY
PV
X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)
P-TYPE DOPANT
BACK CONTACTS
THIN-FILM
TEMPERATURE-PROGRAMMED DESORPTION (TPD)
SCANNING AUGER MICROSCOPY (SAM)
AUGER ELECTRON SPECTROSCOPY (AES)
Solar Energy - Photovoltaics