Contaminant Analysis of Polycrystalline and Single Crystal Niobium Used in Accelerator Cavities
Conference
·
OSTI ID:859453
Secondary Ion Mass Spectrometry (SIMS) can characterize the surface and near surface of Nb used in accelerator cavities. Results show Nb oxide in the 2-3 nm range, a depleted H concentration in the oxide compared with the bulk, and N, C, O lower in an annealed single crystal sample than several polycrystalline samples. Other metallic contaminants are primarily at the surface, but tantalum is distributed uniformly through the material.
- Research Organization:
- Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
- Sponsoring Organization:
- USDOE - Office of Energy Research (ER)
- DOE Contract Number:
- AC05-84ER40150
- OSTI ID:
- 859453
- Report Number(s):
- JLAB-ACC-05-445; DOE/ER/40150-3631; TRN: US0504775
- Resource Relation:
- Conference: 12th SRF Workshop, Cornell University, July 10, 2005
- Country of Publication:
- United States
- Language:
- English
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