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Title: Recent developments in semiconductor gamma-ray detectors

Conference ·
OSTI ID:841558

The successful development of lithium-drifted Ge detectors in the 1960's marked the beginning of the significant use of semiconductor crystals for direct detection and spectroscopy of gamma rays. In the 1970's, high-purity Ge became available, which enabled the production of complex detectors and multi-detector systems. In the following decades, the technology of semiconductor gamma-ray detectors continued to advance, with significant developments not only in Ge detectors but also in Si detectors and room-temperature compound-semiconductor detectors. In recent years, our group at Lawrence Berkeley National Laboratory has developed a variety of gamma ray detectors based on these semiconductor materials. Examples include Ge strip detectors, lithium-drifted Si strip detectors, and coplanar-grid CdZnTe detectors. These advances provide new capabilities in the measurement of gamma rays, such as the ability to perform imaging and the realization of highly compact spectroscopy systems.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE. Administrator for National Nuclear Security Administration Nonproliferation and National Security Program Direction (US)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
841558
Report Number(s):
LBNL-52403; R&D Project: RNN101; TRN: US200515%%207
Resource Relation:
Conference: Methods and Applications of Radioanalytical Chemistry - VI, Kailua-Kona, HI (US), 04/07/2003--04/11/2003; Other Information: PBD: 28 Oct 2003
Country of Publication:
United States
Language:
English