A new bend magnet beam line for scanning transmission x-ray microscopy at the Advanced Light Source

Journal Article · Wed Dec 12 00:00:00 EST 2001 · Journal of Synchrotron Radiation

OSTI ID:837913

Warwick, Tony; Ade, Harald; Kilcoyne, A.L. David; Kritscher, Michael; Tylisczcak, Tolek; Fakra, Sirine; Hitchcock, Adam P; Hitchcock, Peter; Padmore, Howard A

The high brightness of the bend magnets at the Advanced Light Source has been exploited to illuminate a Scanning Transmission X-ray Microscope (STXM). This is the first diffraction-limited scanning x-ray microscope to operate with useful count rate on a synchrotron bend magnet source. A simple, dedicated beam line has been built covering the range of photon energy from 250 eV to 600 eV. Ease of use and operational availability are radically improved compared to previous installations using undulator beams. This facility provides radiation for C 1s, N 1s and O 1s near edge x-ray absorption spectro-microscopy with a spectral resolution up to about 1:5000 and with STXM count rates in excess of 1 MHz.

• Research Organization: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: USDOE Director. Office of Energy Research. Office of Basic Energy Sciences. Materials Sciences Division Contracts DE-AC03-76SF00098 and DE-FG02-98ER45737; Natural Sciences and Engineering Research Council of Canada, Canada Research Chair Program (US)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 837913
• Report Number(s): LBNL-49289; R&D Project: A580ES; TRN: US0501160
• Journal Information: Journal of Synchrotron Radiation, Vol. 9; Other Information: Submitted to Journal of Synchrotron Radiation: Volume 9; Journal Publication Date: 07/2002; PBD: 12 Dec 2001
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
47 OTHER INSTRUMENTATION
ABSORPTION
ADVANCED LIGHT SOURCE
AVAILABILITY
BRIGHTNESS
MAGNETS
MICROSCOPES
MICROSCOPY
PHOTONS
RADIATIONS
RESOLUTION
SYNCHROTRONS
WIGGLER MAGNETS