Atomic resolution transmission electron microscopy of the intergranular structure of a Y{sub 2}O{sub 3}-silicon nitride ceramic
Journal Article
·
· Journal of the American Ceramic Society
OSTI ID:823285
High-resolution transmission electron microscopy (HRTEM) employing focus-variation phase-reconstruction methods is used to image the atomic structure of grain boundaries in a silicon nitride ceramic at a resolution of 0.8 Angstrom
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Director, Office of Science (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 823285
- Report Number(s):
- LBNL-50368; JACTAW; R&D Project: 511906; TRN: US200415%%383
- Journal Information:
- Journal of the American Ceramic Society, Vol. 86, Issue 10; Other Information: Journal Publication Date: 10/2003; PBD: 1 May 2002; ISSN 0002-7820
- Country of Publication:
- United States
- Language:
- English
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