High Gain, Fast Scan, Broad Spectrum, Parallel Beam Wavelength Dispersive X-ray Spectrometer for SEM
Parallax Research, Inc. proposes to produce a new type of x-ray spectrometer for use with Scanning Electron Microscopy (SEM) that would have the energy resolution of WDS and the ease of use of EDS with sufficient gain for lower energies that it can be used at low beam currents as is EDS. Parallax proposes to do this by development of new multiple reflection x-ray collimation optics, new diffractor technology, new detector technology and new scan algorithms.
- Research Organization:
- Parallax Research, Inc. (US)
- Sponsoring Organization:
- USDOE Office of Science (SC) (US)
- DOE Contract Number:
- FG02-02ER83545
- OSTI ID:
- 814961
- Report Number(s):
- Final Report; TRN: US200322%%19
- Resource Relation:
- Other Information: PBD: 12 Sep 2003
- Country of Publication:
- United States
- Language:
- English
Similar Records
High gain, Fast Scan, Broad Spectrum Parallel Beam Wavelength Dispersive X-ray Spectrometer for SEM
A controlled dispersion parallel wavelength x-ray spectrometer for electron microscopy
Use of SEM (scanning electron microscopy) with wavelength-dispersive spectrometry for organic oxygen in coal
Technical Report
·
Fri May 08 00:00:00 EDT 2009
·
OSTI ID:814961
A controlled dispersion parallel wavelength x-ray spectrometer for electron microscopy
Conference
·
Tue Jan 01 00:00:00 EST 1991
·
OSTI ID:814961
Use of SEM (scanning electron microscopy) with wavelength-dispersive spectrometry for organic oxygen in coal
Conference
·
Thu Jan 01 00:00:00 EST 1987
· Preprints of Papers, American Chemical Society, Division of Fuel Chemistry; (USA)
·
OSTI ID:814961
+1 more