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Title: Bulk band gaps in divalent hexaborides: A soft x-ray emission study

Conference ·
OSTI ID:797838

Boron K-edge soft x-ray emission and absorption are used to address the fundamental question of whether divalent hexaborides are intrinsic semimetals or defect-doped bandgap insulators. These bulk sensitive measurements, complementary and consistent with surface-sensitive angle-resolved photoemission experiments, confirm the existence of a bulk band gap and the location of the chemical potential at the bottom of the conduction band.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Director, Office of Science. Office of Basic Energy Studies. Materials Science and Engineering Division (US)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
797838
Report Number(s):
LBNL-49193; R&D Project: A58082; B& R KC0204016; TRN: US0202040
Resource Relation:
Conference: XIII International Conference on Vacuum Ultraviolet Radiation Physics, VUV-13, Trieste (IT), 07/23/2001--07/27/2001; Other Information: PBD: 3 Oct 2001
Country of Publication:
United States
Language:
English