Measurement of the energy-spread contribution to information transfer limits in HR-TEM
Conference
·
OSTI ID:793774
Sub-Angstrom TEM of materials at intermediate voltages requires a sub-Angstrom information limit for the microscope. With a Scherzer resolution of 1.7 Angstrom, but a sub-Angstrom information limit, the one-Angstrom microscope (OAM) project at the NCEM is able to generate resolution below 0.8 Angstrom. Microscope information limit comes from damping of transfer by the temporal coherence. A major term contributing to temporal coherence is energy spread in the electron beam. We derive a new expression for the energy spread, and show how it can be measured from the result that is obtained using a standard electron spectrometer.
- Research Organization:
- Ernest Orlando Lawrence Berkeley National Lab., CA (US)
- Sponsoring Organization:
- USDOE Director, Office of Science. Office of Basic Energy Studies. Division of Materials Sciences (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 793774
- Report Number(s):
- LBNL-49677; R&D Project: 503601; TRN: US200208%%59
- Resource Relation:
- Conference: The 15th International Congress on Electron Microscopy (ICEM-15), Durban (ZA), 09/01/2002--09/06/2002; Other Information: PBD: 18 Feb 2002
- Country of Publication:
- United States
- Language:
- English
Similar Records
Estimation of the electron beam energy spread for TEM information limit
Using coherent illumination to extend HRTEM resolution: Why we need a FEG-TEM for HREM
Using coherent illumination to extend HRTEM resolution: Why we need a FEG-TEM for HREM
Conference
·
Wed Feb 20 00:00:00 EST 2002
·
OSTI ID:793774
Using coherent illumination to extend HRTEM resolution: Why we need a FEG-TEM for HREM
Conference
·
Sun Nov 01 00:00:00 EST 1992
·
OSTI ID:793774
Using coherent illumination to extend HRTEM resolution: Why we need a FEG-TEM for HREM
Conference
·
Sun Nov 01 00:00:00 EST 1992
·
OSTI ID:793774