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Title: The BTeV DAQ and Trigger System - Some throughput, usability and fault tolerance aspects

Conference ·
OSTI ID:784508

As presented at the last CHEP conference, the BTeV triggering and data collection pose a significant challenge in construction and operation, generating 1.5 Terabytes/second of raw data from over 30 million detector channels. We report on facets of the DAQ and trigger farms. We report on the current design of the DAQ, especially its partitioning features to support commissioning of the detector. We are exploring collaborations with computer science groups experienced in fault tolerant and dynamic real-time and embedded systems to develop a system to provide the extreme flexibility and high availability required of the heterogeneous trigger farm ({approximately} ten thousand DSPs and commodity processors). We describe directions in the following areas: system modeling and analysis using the Model Integrated Computing approach to assist in the creation of domain-specific modeling, analysis, and program synthesis environments for building complex, large-scale computer-based systems; System Configuration Management to include compilable design specifications for configurable hardware components, schedules, and communication maps; Runtime Environment and Hierarchical Fault Detection/Management--a system-wide infrastructure for rapidly detecting, isolating, filtering, and reporting faults which will be encapsulated in intelligent active entities (agents) to run on DSPs, L2/3 processors, and other supporting processors throughout the system.

Research Organization:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Energy Research (ER) (US)
DOE Contract Number:
AC02-76CH03000
OSTI ID:
784508
Report Number(s):
FERMILAB-Conf-01/227-E; TRN: US0106134
Resource Relation:
Conference: Computing in High Energy and Nuclear Physics, Beijing (CN), 09/03/2001--09/07/2001; Other Information: PBD: 20 Aug 2001
Country of Publication:
United States
Language:
English