ELECTRON MICROSCOPY ANALYSIS OF THE INTERMEDIATE PHASES FORMED DURING THE NUCLEATION OF YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} FILM
Conference
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OSTI ID:780680
Recently, considerable efforts have been made in growing bi-axially aligned thick YBa{sub 2}Cu{sub 3}O{sub 7} (YBCO) films on a flexible, textured metallic substrate for electrical power applications. The BaF{sub 2} post-deposition annealing process is one of the most promising methods. To understand the nucleation and growth mechanism of YBCO in this process, extended transmission electron microscopy analysis has been made. Here, we report on the evolution of Ba-Y oxy-fluoride which is pertinent to the epitaxial YBCO nucleation process on SrTiO{sub 3} (STO) substrate.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research (ER) (US)
- DOE Contract Number:
- AC02-98CH10886
- OSTI ID:
- 780680
- Report Number(s):
- BNL-68153; KC0201010; R&D Project: EST015NEEA; KC0201010; TRN: AH200121%%30
- Resource Relation:
- Conference: MICROSCOPY AND MICROANALYSIS 2001, LONG BEACH, CA (US), 08/05/2001--08/09/2001; Other Information: PBD: 5 Aug 2001
- Country of Publication:
- United States
- Language:
- English
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