Representation of Random Shock via the Karhunen Loeve Expansion

Conference · Fri Dec 08 00:00:00 EST 2000

OSTI ID:771524

PAEZ, THOMAS L; HUNTER, NORMAN F

Shock excitations are normally random process realizations, and most of our efforts to represent them either directly or indirectly reflect this fact. The most common indirect representation of shock sources is the shock response spectrum. It seeks to establish the damage-causing potential of random shocks in terms of responses excited in linear, single-degree-of-freedom systems. This paper shows that shock sources can be represented directly by developing the probabilistic and statistical structure that underlies the random shock source. Confidence bounds on process statistics and probabilities of specific excitation levels can be established from the model. Some numerical examples are presented.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Sandia National Lab. (SNL-CA), Livermore, CA (United States)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 771524
• Report Number(s): SAND2000-3053C; TRN: AH200118%%364
• Resource Relation: Conference: Shock and Vibration Symposium, Washington, DC (US), 11/07/2000--11/09/2000; Other Information: PBD: 8 Dec 2000
• Country of Publication: United States
• Language: English

Related Subjects

99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
IMPACT SHOCK
EXCITATION
MATHEMATICAL MODELS
PROBABILISTIC ESTIMATION
STATISTICS