Phase Identification of Individual Crystalline Particles by Electron Backscatter Diffraction (EBSD)
Recently, an EBSD system was developed that uses a 1024 x 1024 CCD camera coupled to a thin phosphor. This camera has been shown to produce excellent EBSD patterns. In this system, crystallographic information is determined from the EBSD pattern and coupled with the elemental information from energy or wavelength dispersive x-ray spectrometry. Identification of the crystalline phase of a sample is then made through a link to a commercial diffraction database. To date, this system has been applied almost exclusively to conventional, bulk samples that have been polished to a flat surface. In this investigation, the authors report on the application of the EBSD system to the phase identification analysis (PIA) of individual micrometer and submicrometer particles rather than flat surfaces.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Sandia National Lab. (SNL-CA), Livermore, CA (United States)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 759859
- Report Number(s):
- SAND2000-1483J; TRN: AH200031%%120
- Journal Information:
- Journal of Microscopy U, Other Information: Submitted to Journal of Microscopy U; PBD: 12 Jun 2000
- Country of Publication:
- United States
- Language:
- English
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