Modeling the responses of TSM resonators under various loading conditions
Abstract
The authors developed a general model that describes the electrical responses of thickness shear mode resonators subject to a variety of surface conditions. The model incorporates a physically diverse set of single component loadings, including rigid solids, viscoelastic media, and fluids (Newtonian or Maxwellian). The model allows any number of these components to be combined in any configuration. Such multiple loadings are representative of a variety of physical situations encountered in electrochemical and other liquid phase applications, as well as gas phase applications. In the general case, the response of the composite load is not a linear combination of the individual component responses. The authors discuss application of the model in a qualitative diagnostic fashion to gain insight into the nature of the interfacial structure, and in a quantitative fashion to extract appropriate physical parameters such as liquid viscosity and density, and polymer shear moduli.
- Authors:
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Sandia National Lab. (SNL-CA), Livermore, CA (United States)
- Sponsoring Org.:
- US Department of Energy (US)
- OSTI Identifier:
- 751441
- Report Number(s):
- SAND99-0631
TRN: AH200020%%143
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Technical Report
- Resource Relation:
- Other Information: PBD: 1 Mar 1999
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; MICROBALANCES; MATHEMATICAL MODELS; RESONATORS; RESPONSE FUNCTIONS; PHYSICAL PROPERTIES; SHEAR PROPERTIES; POLYMERS; LIQUIDS; THIN FILMS; THICKNESS-SHEAR MODE RESONATOR; QUARTZ CRYSTAL MICROBALANCE; VISCOELASTICITY; FLUIDS
Citation Formats
BANDEY, HELEN L, MARTIN, STEPHEN J, CERNOSEK, RICHARD W, and HILLMAN, A ROBERT. Modeling the responses of TSM resonators under various loading conditions. United States: N. p., 1999.
Web. doi:10.2172/751441.
BANDEY, HELEN L, MARTIN, STEPHEN J, CERNOSEK, RICHARD W, & HILLMAN, A ROBERT. Modeling the responses of TSM resonators under various loading conditions. United States. https://doi.org/10.2172/751441
BANDEY, HELEN L, MARTIN, STEPHEN J, CERNOSEK, RICHARD W, and HILLMAN, A ROBERT. 1999.
"Modeling the responses of TSM resonators under various loading conditions". United States. https://doi.org/10.2172/751441. https://www.osti.gov/servlets/purl/751441.
@article{osti_751441,
title = {Modeling the responses of TSM resonators under various loading conditions},
author = {BANDEY, HELEN L and MARTIN, STEPHEN J and CERNOSEK, RICHARD W and HILLMAN, A ROBERT},
abstractNote = {The authors developed a general model that describes the electrical responses of thickness shear mode resonators subject to a variety of surface conditions. The model incorporates a physically diverse set of single component loadings, including rigid solids, viscoelastic media, and fluids (Newtonian or Maxwellian). The model allows any number of these components to be combined in any configuration. Such multiple loadings are representative of a variety of physical situations encountered in electrochemical and other liquid phase applications, as well as gas phase applications. In the general case, the response of the composite load is not a linear combination of the individual component responses. The authors discuss application of the model in a qualitative diagnostic fashion to gain insight into the nature of the interfacial structure, and in a quantitative fashion to extract appropriate physical parameters such as liquid viscosity and density, and polymer shear moduli.},
doi = {10.2172/751441},
url = {https://www.osti.gov/biblio/751441},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Mar 01 00:00:00 EST 1999},
month = {Mon Mar 01 00:00:00 EST 1999}
}